Machine learning sparse tight-binding parameters for defects
نویسندگان
چکیده
Abstract We employ machine learning to derive tight-binding parametrizations for the electronic structure of defects. test several methods that map atomic and a defect onto sparse parameterization. Since Multi-layer perceptrons (i.e., feed-forward neural networks) perform best we adopt them our further investigations. demonstrate accuracy parameterizations range important properties such as band structure, local density states, transport level spacing simulations two common defects in single layer graphene. Our approach achieves results comparable maximally localized Wannier functions DFT accuracy) without prior knowledge about while also allowing reduced interaction which substantially reduces calculation time. It is general can be applied wide other materials, enabling accurate large-scale material presence different
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ژورنال
عنوان ژورنال: npj computational materials
سال: 2022
ISSN: ['2057-3960']
DOI: https://doi.org/10.1038/s41524-022-00791-x